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Specify circuit test messages.

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Adam Ierymenko 11 years ago
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1 changed files with 167 additions and 5 deletions
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  1. 172
      node/Packet.hpp

172
node/Packet.hpp
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@ -553,10 +553,10 @@ public:
* address that require re-establishing connectivity.
*
* Destination address types and formats (not all of these are used now):
* 0 - None -- no destination address data present
* 1 - Ethernet address -- format: <[6] Ethernet MAC>
* 4 - 6-byte IPv4 UDP address/port -- format: <[4] IP>, <[2] port>
* 6 - 18-byte IPv6 UDP address/port -- format: <[16] IP>, <[2] port>
* 0x00 - None -- no destination address data present
* 0x01 - Ethernet address -- format: <[6] Ethernet MAC>
* 0x04 - 6-byte IPv4 UDP address/port -- format: <[4] IP>, <[2] port>
* 0x06 - 18-byte IPv6 UDP address/port -- format: <[16] IP>, <[2] port>
*
* OK payload:
* <[8] timestamp (echoed from original HELLO)>
@ -904,7 +904,169 @@ public:
*
* OK and ERROR are not generated.
*/
VERB_PUSH_DIRECT_PATHS = 16
VERB_PUSH_DIRECT_PATHS = 16,
/* Source-routed circuit test message:
* <[5] address of originator of circuit test>
* <[2] 16-bit flags>
* <[8] 64-bit timestamp>
* <[8] 64-bit test ID (arbitrary, set by tester)>
* <[1] originator credential type (for authorizing test)>
* <[...] credential>
* <[2] 16-bit length of additional fields>
* <[...] additional fields>
* <[2] 16-bit length of signature of request>
* <[...] signature of request by originator>
* <[1] previous hop credential type>
* <[...] previous hop credential>
* <[...] next hop(s) in path>
*
* Flags:
* 0x01 - Report back to originator at each hop
* 0x02 - Report back to originator at last hop
*
* Originator credential types:
* 0x00 - No credentials included
* 0x01 - 64-bit network ID for which originator is controller
*
* Previous hop credential types:
* 0x00 - No credentials included
* 0x01 - Certificate of network membership
*
* Path record format:
* <[1] 8-bit flags>
* <[1] 8-bit breadth (number of next hops)>
* <[...] one or more ZeroTier addresses of next hops>
*
* Path record flags (in each path record):
* 0x80 - End of path (should be set on last entry)
*
* The circuit test allows a device to send a message that will traverse
* the network along a specified path, with each hop optionally reporting
* back to the tester via VERB_CIRCUIT_TEST_REPORT.
*
* Each circuit test packet includes a digital signature by the originator
* of the request, as well as a credential by which that originator claims
* authorization to perform the test. Currently this signature is ed25519,
* but in the future flags might be used to indicate an alternative
* algorithm. For example, the originator might be a network controller.
* In this case the test might be authorized if the recipient is a member
* of a network controlled by it, and if the previous hop(s) are also
* members. Each hop may include its certificate of network membership.
*
* Circuit test paths consist of a series of records. When a node receives
* an authorized circuit test, it:
*
* (1) Reports back to circuit tester as flags indicate
* (2) Reads and removes the next hop from the packet's path
* (3) Sends the packet along to next hop(s), if any.
*
* It is perfectly legal for a path to contain the same hop more than
* once. In fact, this can be a very useful test to determine if a hop
* can be reached bidirectionally and if so what that connectivity looks
* like.
*
* The breadth field in source-routed path records allows a hop to forward
* to more than one recipient, allowing the tester to specify different
* forms of graph traversal in a test.
*
* There is no hard limit to the number of hops in a test, but it is
* practically limited by the maximum size of a (possibly fragmented)
* ZeroTier packet.
*
* Support for circuit tests is optional. If they are not supported, the
* node should respond with an UNSUPPORTED_OPERATION error. If a circuit
* test request is not authorized, it may be ignored or reported as
* an INVALID_REQUEST. No OK messages are generated, but TEST_REPORT
* messages may be sent (see below).
*
* ERROR packet format:
* <[8] 64-bit timestamp (echoed from original>
* <[8] 64-bit test ID (echoed from original)>
*/
VERB_CIRCUIT_TEST = 17,
/* Circuit test hop report:
* <[8] 64-bit timestamp (from original test)>
* <[8] 64-bit test ID (from original test)>
* <[8] 64-bit reporter timestamp (reporter's clock, 0 if unspec)>
* <[1] 8-bit vendor ID (set to 0, currently unused)>
* <[1] 8-bit reporter protocol version>
* <[1] 8-bit reporter major version>
* <[1] 8-bit reporter minor version>
* <[2] 16-bit reporter revision>
* <[2] 16-bit reporter OS/platform>
* <[2] 16-bit reporter architecture>
* <[2] 16-bit error code (set to 0, currently unused)>
* <[8] 64-bit report flags>
* <[8] 64-bit source packet ID>
* <[1] 8-bit source packet hop count>
* <[1] 8-bit source address type>
* [<[...] source address>]
* <[2] 16-bit length of network information>
* <[...] network information>
* <[2] 16-bit length of additional fields>
* <[...] additional fields>
* <[2] 16-bit number of next hops to which something is being sent>
* <[...] next hop information>
*
* Circuit test report flags:
* (currently none, must be zero)
*
* Next hop information record format:
* <[5] ZeroTier address of next hop>
* <[1] 8-bit destination wire address type>
* <[...] destination wire address>
*
* See enums below for OS/platform and architecture. Source address format
* is the same as specified in HELLO.
*
* Circuit test reports can be sent by hops in a circuit test to report
* back results. They should include information about the sender as well
* as about the paths to which next hops are being sent.
*
* If a test report is received and no circuit test was sent, it should be
* ignored. This message generates no OK or ERROR response.
*/
VERB_CIRCUIT_TEST_REPORT = 18
};
/**
* Platforms reported in circuit tests
*/
enum CircuitTestReportPlatform
{
CIRCUIT_TEST_REPORT_PLATFORM_UNSPECIFIED = 0,
CIRCUIT_TEST_REPORT_PLATFORM_LINUX = 1,
CIRCUIT_TEST_REPORT_PLATFORM_WINDOWS = 2,
CIRCUIT_TEST_REPORT_PLATFORM_MACOS = 3,
CIRCUIT_TEST_REPORT_PLATFORM_ANDROID = 4,
CIRCUIT_TEST_REPORT_PLATFORM_IOS = 5,
CIRCUIT_TEST_REPORT_PLATFORM_SOLARIS_SMARTOS = 6,
CIRCUIT_TEST_REPORT_PLATFORM_FREEBSD = 7,
CIRCUIT_TEST_REPORT_PLATFORM_NETBSD = 8,
CIRCUIT_TEST_REPORT_PLATFORM_OPENBSD = 9,
CIRCUIT_TEST_REPORT_PLATFORM_RISCOS = 10,
CIRCUIT_TEST_REPORT_PLATFORM_VXWORKS = 11,
CIRCUIT_TEST_REPORT_PLATFORM_FREERTOS = 12,
CIRCUIT_TEST_REPORT_PLATFORM_SYSBIOS = 13,
CIRCUIT_TEST_REPORT_PLATFORM_HURD = 14
};
/**
* Architectures reported in circuit tests
*/
enum CircuitTestReportArchitecture
{
CIRCUIT_TEST_REPORT_ARCH_UNSPECIFIED = 0,
CIRCUIT_TEST_REPORT_ARCH_X86 = 1,
CIRCUIT_TEST_REPORT_ARCH_X64 = 2,
CIRCUIT_TEST_REPORT_ARCH_ARM32 = 3,
CIRCUIT_TEST_REPORT_ARCH_ARM64 = 4,
CIRCUIT_TEST_REPORT_ARCH_MIPS32 = 5,
CIRCUIT_TEST_REPORT_ARCH_MIPS64 = 6,
CIRCUIT_TEST_REPORT_ARCH_POWER32 = 7,
CIRCUIT_TEST_REPORT_ARCH_POWER64 = 8
};
/**

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